TERESA, Dr. V. V.; DURAIVEL, Dr. A. N.; KOKILAMANI, Ms.S.; R, Ms. Saranya. Cross-Technology Evaluation of a Gate-Diffusion-Input Magnitude Comparator for Scalable CMOS Architectures. INTERNATIONAL JOURNAL OF ADVANCES IN SIGNAL AND IMAGE SCIENCES, [S. l.], p. 104–123, 2026. DOI: 10.29284/ijasis.12.1.2026.104-123. Disponível em: https://xlescience.org/index.php/IJASIS/article/view/433. Acesso em: 24 oct. 2026.