HASIN ALAM; SAJU MOHANAN. AN EFFICIENT QUALITY CONTROL SYSTEM BY MACHINE LEARNING FOR SURFACE DEFECTS . INTERNATIONAL JOURNAL OF ADVANCES IN SIGNAL AND IMAGE SCIENCES, [S. l.], v. 7, n. 2, p. 40–48, 2021. DOI: 10.29284/ijasis.7.2.2021.40-48. Disponível em: https://xlescience.org/index.php/IJASIS/article/view/78.. Acesso em: 22 nov. 2024.